Fabrication and Properties of Patterned Nichrome Thin Film Using MEMs Technology

Article Preview

Abstract:

A patterned nichrome thin film used for strain gauge was prepared on the glass substrate using microelectromechanical system (MEMS) micromachining process. The nichrome sensitive element had a width of 10μm and a thickness of 0.3μm. The electrical properties of the nichrome film were investigated, and a stable TCR of 1.2×10-4/°C was obtained.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

1496-1499

Citation:

Online since:

March 2014

Keywords:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Angadi M A, Whiting R. Longitudinal and transverse strain sensitivity of nichrome films[J]. Materials Science and Engineering: B, 1990, 7(1): L1-L4.

DOI: 10.1016/0921-5107(90)90020-c

Google Scholar

[2] Garcia-Alonso A, Garcia J, Castano E, et al. Strain sensitivity and temperature influence on sputtered thin films for piezoresistive sensors[J]. Sensors and Actuators A: Physical, 1993, 37: 784-789.

DOI: 10.1016/0924-4247(93)80132-z

Google Scholar

[3] Kazi I H, Wild P M, Moore T N, et al. The electromechanical behavior of nichrome (80/20 wt. %) film[J]. Thin Solid Films, 2003, 433(1): 337-343.

DOI: 10.1016/s0040-6090(03)00390-0

Google Scholar

[4] Imam H. Kazi, P.M. Wild, T.N. Moore, M. Sayer. Characterization of sputtered nichrome (Ni–Cr 80/20 wt. %) films for strain gauge applications. Thin Solid Films 515 (2006) 2602 – 2606.

DOI: 10.1016/j.tsf.2005.10.077

Google Scholar

[5] Kayser P, Godefroy J C, Leca L. High-temperature thin-film strain gauges[J]. Sensors and Actuators A: Physical, 1993, 37: 328-332.

DOI: 10.1016/0924-4247(93)80055-l

Google Scholar