Controlling the Growth of ZnO-SiO2 Nanostructures Using Pt-Coated Si Substrate

Amber Dea Marie V. Peguit; Rolando T. Candidato; Reynaldo M. Vequizo; Majvell Kay G. Odarve; Bianca Rae B. Sambo; Filchito Renè G. Bagsican; Jess E. Gambe; Giovanni G. Paylaga; Marven E. Jabian; Arnold C. Alguno

doi:10.4028/www.scientific.net/AMM.548-549.354

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 548-549Controlling the Growth of ZnO-SiO2 Nanostructures...

Controlling the Growth of ZnO-SiO₂ Nanostructures Using Pt-Coated Si Substrate

Abstract:

ZnO-SiO₂ nanostructures were grown on both bare Si and Pt-coated Si substrates via chemical bath deposition (CBD). The grown nanostructures were characterized using Scanning Electron Microscope with Energy Dispersive X-ray Spectroscopy (SEM-EDS), Fourier Transform Infrared (FTIR) measurement and Ultraviolet-Visible (UV-Vis) absorption spectroscopy. Surface morphology results revealed that Pt-coated Si substrate have promoted the growth of ZnO-SiO₂ nanostructures by providing more active sites for nucleation thus formation ZnO-SiO₂ nanostructures were observed. It is believed that SiO₂ will adhere to the non-polar sides of the grown ZnO nanostructures. This result is manifested in the FTIR spectra which showed a pronounced peak corresponding to ZnO-SiO₂ grown on bare Si suggesting that more Si-O bonds are present. However, Pt-coating did not significantly affect the band gap of the grown ZnO-SiO₂ nanostructures.

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Periodical:

Applied Mechanics and Materials (Volumes 548-549)

Pages:

354-357

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.548-549.354

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Online since:

April 2014

Authors:

Amber Dea Marie V. Peguit, Rolando T. Candidato, Reynaldo M. Vequizo, Majvell Kay G. Odarve, Bianca Rae B. Sambo, Filchito Renè G. Bagsican, Jess E. Gambe, Giovanni G. Paylaga, Marven E. Jabian*, Arnold C. Alguno

Keywords:

Amorphous Silica Powder, Optical Band Gap, Pt-Coated Si, Surface Morphology, ZnO-SiO₂

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References

[1] N.K. Hassan, M.R. Hashim, M.A. Mahdi and N.K. Allam: ECS Journal of Solid State Science and Technology Vol. 1 (2012), pp.86-89.

Google Scholar

[2] C.D. Lokhande, P.M. Gondkar, R. Mane, V.R. Shinde and S.H. Han: Journal of Alloys and Compounds Vol. 475 (2009), pp.304-311.

DOI: 10.1016/j.jallcom.2008.07.025

Google Scholar

[3] A. Laurentowska and T. Jesionowski: Physiocochem. Probl. Miner. Process Vol. 48 (2012), pp.63-76.

Google Scholar

[4] Y. Yang, Y.Q. Li, H.Q. Shi, W.N. Li, H.M. Xiao, L.P. Zhu, Y.S. Luo, S.Y. Fu and T. Liu: Composites: Part B Vol. 42 (2011), pp.2105-2110.

Google Scholar

[5] R. Hong, T. Pan, J. Qian and H. Li: Chemical Engineering Journal Vol. 119 (2006), pp.71-81.

Google Scholar

[6] H. Yamada, Y. Ushimi, M. Takeuchi, Y. Yoshino, Makino T and Arai S: Vacuum Vol. 74 (2004), pp.689-692.

Google Scholar

[7] J.R. Duclère, C. McLoughlin, J. Fryar, R. O'Haire, M. Guilloux-Viry, A. Meaney, A. Perrin, E. McGlynn, M.O. Henry and J.P. Mosnier: Thin Solid Films Vol. 500 (2006), pp.78-83.

DOI: 10.1016/j.tsf.2005.11.017

Google Scholar

[8] M. Bakar, M. Hamid and A. Jalar: Advanced Research Materials Vol. 97-101 (2010), pp.1550-1553.

Google Scholar

[9] A. Sugunan, H.C. Warad, M. Boman and J. Dutta: J. Sol-Gel Sci Techn Vol. 39 (2006), pp.49-56.

Google Scholar

[10] K.V. Gurav, U.M. Patil, S.M. Pawar, J.H. Kim and C.D. Lokhande: Journal of Alloys and Compounds Vol. 509 (2011), pp.7723-7728.

DOI: 10.1016/j.jallcom.2011.04.094

Google Scholar