The Numerical Control Device Reliability Based on Bayesian Approach

Bin Quan Li

doi:10.4028/www.scientific.net/AMM.556-562.2515

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 556-562The Numerical Control Device Reliability Based on...

The Numerical Control Device Reliability Based on Bayesian Approach

Abstract:

The material selection and manufacturing processes of numerical control device were related with the reliability of system. Therefore, the reliability evaluation of it was significant. Numerical control system was, obviously, high-reliability product and the application of Bayesian theory has become an important means of its reliability assessment. The failure data of numerical control device obeys Weibull distribution which has complex forms. The posterior distribution becomes extremely complicated and the numerical integration which Bayesian computing depends on is not available. Markov chain Monte Carlo (MCMC) method ensures the implementation of the assessment. The result of Bayesian estimation proves that it increases the robustness, accuracy and effectiveness of the calculation and it's suitable for numerical control device reliability evaluation.

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Periodical:

Applied Mechanics and Materials (Volumes 556-562)

Pages:

2515-2518

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.556-562.2515

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Online since:

May 2014

Authors:

Bin Quan Li*

Keywords:

Bayesian Reliability, Markov Chain Monte Carlo (MCMC) Method, Metropolis-Hastings Algorithm, Numerical Control Device

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* - Corresponding Author

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