Implementation of Automatic Test System Based on Virtual Instrument Technology and USB Structure

Mei Gao; Hui Pan

doi:10.4028/www.scientific.net/AMM.556-562.3006

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 556-562Implementation of Automatic Test System Based on...

Implementation of Automatic Test System Based on Virtual Instrument Technology and USB Structure

Abstract:

A distributed ATE based on Virtual Instrument technology and Universal Serial Bus is introduced in this paper. This system is used for on-the-ground testing of a certain equipment of the space craft, to measure its power supply, signal, communication and etc. Because of the advantage of USB being used, this system provided an adaptive test bench for various testing requirement and can be well advanced in testing function.

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Periodical:

Applied Mechanics and Materials (Volumes 556-562)

Pages:

3006-3009

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.556-562.3006

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Online since:

May 2014

Authors:

Mei Gao*, Hui Pan

Keywords:

Distributed ATE, LabVIEW, Universal Serial Bus, Virtual Instrument (VI)

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References

[1] J.A. Jac; puez and H.R. Kuppeheim. Theory of Intergrating Sphere, J. Opt. Soc. Am. Vol. 45, No. 3, 460-470(1955).

Google Scholar

[2] G. Neri, G. D. Cain, T. Salmon, and A. Yardim, A microprocessor-based digital flickermeter, IEEE Trans. Intrum. Meas, vol. 40, pp.1008-1013 (1991).

DOI: 10.1109/19.119783

Google Scholar

[3] K. Srinivasan, Digital measurement of voltage flicker, IEEE Trans. Power Delivery, vol. 6, pp.1593-1598 (1991).

DOI: 10.1109/61.97697

Google Scholar

[4] I. Kamwa and K. Srinivasan, A Kalman filter-based technique for combined digital estimation of voltage flicker and phasor in power distribution systems, ETEP, vol. 3, no. 2, pp.131-142 (1993).

DOI: 10.1002/etep.4450030204

Google Scholar

[5] M. T. Chen, Digital algorithms for measurement of voltage flicker, Proc. Inst. Elec. Eng. Gen. Transm. Distrib., vol. 144, no. 2, pp.175-180 (1997).

DOI: 10.1049/ip-gtd:19970683

Google Scholar

[6] S. Nuccio, A digital instrument for measurement of voltage flicker, Proc. IEEE IMTC, pp.281-284 (1997).

Google Scholar

[7] Electromagnetic Compatibility(EMC)&mdash, Part 4: Testing and Measurement Techniques&mdash, Section 15: Flickermeter&mdash, Functional and Design Specification, IEC 61000-4-15, (1997).

DOI: 10.1109/ieeestd.2011.6053977

Google Scholar