Research on DFT of Digital Circuits Based on IEEE 1149.1 and Based on IEEE 1500

Abstract:

In the field of digital circuit testability design,IEEE 1149.1 standard focuses on System ON board (SOB) test,while the IEEE 1500 standard is for embedded cores test on chip.Although there is a clear definition of two standards, they have a certain relevance.This article will from the process, test principle, test architecture and related test language to analyzethese two standards, concluding that the differences and similarities .Finally, some problems will be pointed out when use the two standards and then make a prospect on the development of the standards.

• Periodical: Applied Mechanics and Materials (Volumes 568-570)
• Pages: 1248-1252
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.568-570.1248
• Online since: June 2014
• Authors: Sheng Jian Chen*, Yong Yu Chen, Xiao Bing Zhu
• Keywords: DFT, IEEE 1149.1, IEEE 1500

References

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