Detecting Local Illumination Using Skewness of Oriented Gradients from a Single Image

Article Preview

Abstract:

In this paper we present a simple and effective method for detecting illumination of a region from a single image. Our method is primarily based on skewness, which is a measure of asymmetry of a data set in statistics. We happen to find out that the skewness value of oriented gradients of an image can measure the directional characteristic of illumination. By choosing appropriate statistical area, we can analyze the subtle changes on the surface of an object. Theoretical analysis and experimental results show that our algorithm is accurate and effective. In the end, we give its application in image authenticity verification problem which is to distinguish real and “flat” objects in a photograph, and it shows excellent results.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

2381-2386

Citation:

Online since:

June 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2011 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Y. Adini, Y. Moses and S. Ullman: Pattern Analysis and Machine Intelligence, Vol. 19 (1997), p.721.

Google Scholar

[2] Y. Matsushita, K. Nishino, K. Ikeuchi and M. Sakauchi: Computer Vision and Pattern Recognition, Vol. 1 (2003), p.3.

Google Scholar

[3] M. D. Levine and J. Bhattacharyya: Pattern Recogn. Lett., Vol. 26 (2005), p.251.

Google Scholar

[4] S. Shan, W. Gao, B. Cao and D. Zhao: IEEE International Workshop on Analysis and Modeling of Faces and Gestures, (2003), p.157.

Google Scholar

[5] C. Fredembach and G. Finlayson: Proceedings of the 18th International Conference on Pattern Recognition, (2006), p.832.

Google Scholar

[6] J. Zhu, K. G. G. Samuel, S. Z. Masood and M. F. Tappen: Computer Vision and Pattern Recognition, (2010), p.223.

Google Scholar

[7] M. F. Tappen, W. T. Freeman and E. H. Adelson: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 27 (2005), p.1459.

DOI: 10.1109/tpami.2005.185

Google Scholar

[8] G. Finlayson, S. Hordley, C. Lu and M. Drew: IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 28 (2006), p.59.

DOI: 10.1109/tpami.2006.18

Google Scholar

[9] G. Finlayson, S. Hordley and M. Drew: Computer Vision - ECCV 2002, ser. Lecture Notes in Computer Science, Vol. 2353(2006), p.129.

Google Scholar

[10] G. Finlayson, C. Fredembach and M. S. Drew: Proc. IEEE 11th Int. Conf. Computer Vision ICCV 2007, p.1.

Google Scholar

[11] Y. Weiss: IEEE International Conference on Computer Vision, Vol. 2 (2001), p.68.

Google Scholar

[12] R. O. Dror, T. K. Leung, E. H. Adelson and A. S. Willsky: IEEE Computer Society Conference on Computer Vision and Pattern Recognition, Vol. 2 (2001), p.164.

DOI: 10.1109/cvpr.2001.990948

Google Scholar

[13] L. Sharan, Y. Li and E. H. Adelson: Journal of Vision, Vol. 6 (2006), p.101.

Google Scholar

[14] I. Motoyoshi, S. Nishida, L. Sharan and E. H. Adelson: Nature, Vol. 447 (2007), p.206.

Google Scholar

[15] L. Sharan, Y. Li, I. Motoyoshi, S. Nishida and E. H. Adelson: J. Opt. Soc. Am. A, Vol. 25 (2008), p.846.

Google Scholar

[16] F. C. Crow: SIGGRAPH Comput. Graph., Vol. 18 (1984), p.207.

Google Scholar

[17] B. T. Phong: Commun. ACM, Vol. 18 (1975), p.311.

Google Scholar

[18] M. Oren and S. K. Nayar: Proceedings of the 21st annual conference on Computer graphics and interactive techniques, (1994), p.239.

Google Scholar

[19] Information on http: /www. sciencemag. org/content/318/5852/893. 1. short.

Google Scholar

[20] H. Yu, T. -T. Ng and Q. Sun: 15th IEEE International Conference on Image Processing, (2008), p.3140.

Google Scholar

[21] H. Cao and A. C. Kot: IEEE International Conference on Acoustics, Speech, and Signal Processing, (2010), p.1790.

Google Scholar