Information Technology for Manufacturing Systems II

Information Technology for Manufacturing Systems II

Description:

The 2011 International Conference on Information Technology for Manufacturing Systems (ITMS 2011) was co-sponsored by the University of Adelaide, Australia and Huazhong University of Science and Technology, China. Its mission was to bring together innovative academics and industrial experts in the field of Materials Science and Mechanical Science.
Volume is indexed by Thomson Reuters CPCI-S (WoS).
The proceedings consist of over 467 peer-reviewed papers which offer an uniquely up-to-date survey of the topic.

Purchase this book:

eBook
978-3-03813-532-6
$198.00 *
Print
978-3-03785-149-4
eBook+Print
978-3-03785-149-4
$607.20 *
* 1-User Access (Single User-Price). For Multi-User-Price please fill a contact form

Info:

Editors:
Qi Luo
THEMA:
TGM
BISAC:
TEC021000
Details:
Selected, peer reviewed papers from the 2011 International Conference on Information Technology for Manufacturing Systems (ITMS 2011), Shanghai, China, May 7-8, 2011
Pages:
2800
Book Set:
3 Books set
Year:
2011
ISBN-13 (softcover):
9783037851494
ISBN-13 (CD):
9783037851500
ISBN-13 (eBook):
9783038135326
Permissions CCC:
Permissions PLS:
Share:

Review from Ringgold Inc., ProtoView: Hundreds of papers are presented in three thick volumes representing the proceedings of the International Conference on Information Technology for Manufacturing systems (ITMS 2011), held May 2011, in Shanghai, China, co-sponsored by U. Adelaide, Australia and Huazhong U. of Science and Technology, China. Arrangement of articles is random. A small sampling of topics to give an idea of range of topics: technical objects relation model in manufacturing enterprise, dyeing properties of acid dyes for different tree species, broadcast encryption on cable TV applications, life estimation of car hub bearing, detection of eggshell crack based on acoustic feature and support vector machine, strategy of repeats in DNA sequence assembly, and thermal wave image reconstruction of bonding defects in missile engine shell. There is a keyword index allowing for some access to the contents by subject. However most of the index entries (e.g. digital holography, economy of markets, error measuring, failure analysis, intelligent assembly) have only one page number indicated, and hence refer only to one article. A listing of authors and articles facilitates those looking for their own or a colleague's article.