Optimization of Reliability Test on the Shell of Portable Electronic Products Based on Taguchi Method

Xue Mei Du; Wei Lei; Nai Jia Wang; Jing Yu Ding

doi:10.4028/www.scientific.net/AMM.599-601.1021

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 599-601Optimization of Reliability Test on the Shell of...

Optimization of Reliability Test on the Shell of Portable Electronic Products Based on Taguchi Method

Abstract:

Traditional reliability test of electronic products has the feature of many contents, long cycle and rising test fees. This paper analyzes the feasibility of combination of Taguchi method and reliability test. Then, the process of optimizing reliability test is proposed with emphasis on use of Taguchi method such as orthogonal table and signal-to-noise ratio (SNR). Finally, the process is applied to the reliability test on the shell of a new type of portable electronic product developed by C Company, verifying that the new process is operable and can reduce test numbers, time and cost while guaranteeing effectiveness of reliability test compared with the traditional approach.

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Periodical:

Applied Mechanics and Materials (Volumes 599-601)

Pages:

1021-1024

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.599-601.1021

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Online since:

August 2014

Authors:

Xue Mei Du*, Wei Lei, Nai Jia Wang, Jing Yu Ding

Keywords:

Portable Electronic Products, Reliability Test, Taguchi Method

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References

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