Pile Defect Intelligent Identification Based on Wavelet Analysis and Neural Networks

Guang Zhang; Xiu Ling Jiang; Zhi Jun Liu; Chang Chuan Chen

doi:10.4028/www.scientific.net/AMM.608-609.899

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 608-609Pile Defect Intelligent Identification Based on...

Pile Defect Intelligent Identification Based on Wavelet Analysis and Neural Networks

Abstract:

In view of the phenomenon of pile test results are greatly influenced by human , the paper puts forward that to combine wavelet analysis and neural network for pile testing, use the extreme value point of the wavelet analysis as the input of neural networks, depending on the output codes to determine the defect types and position. And it is believed that there is a good potential for use in future.

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Periodical:

Applied Mechanics and Materials (Volumes 608-609)

Pages:

899-902

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.608-609.899

Citation:

Cite this paper

Online since:

October 2014

Authors:

Guang Zhang*, Xiu Ling Jiang, Zhi Jun Liu, Chang Chuan Chen

Keywords:

Neural Network (NN), Pile Testing, Wavelet Analysis

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* - Corresponding Author

References

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