A Study on the Electrical Properties of Gan-Based Alpha Particle Detector

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Abstract:

Pin structure GaN-based alpha particle detector with epitaxial growth on c-plane sapphire substrate through metal organic chemical vapor deposition (MOCVD) method, uses electron beam evaporation and photoetching machine to produce the ohmic contact electrodes of device. The electrical properties of device which were tested by I-V and C-V show that the device’s reverse leakage current is 9.9μA at 100V reverse bias voltage is at; and the detector’s junction capacitance is 19pF at 20V reverse bias voltage.

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457-460

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August 2014

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© 2014 Trans Tech Publications Ltd. All Rights Reserved

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