Defect Inspection for SMD Inductors

Chun Li Chang; Wen Hong Wu; Rui Cian Weng; Chi Hung Hwang

doi:10.4028/www.scientific.net/AMM.635-637.989

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 635-637Defect Inspection for SMD Inductors

Defect Inspection for SMD Inductors

Abstract:

This paper presents a machine vision inspection method for winding high frequency inductors, which affects the reliability and quality of the electronic products. This paper proposes how to quickly and correctly improve the quality of component detection, an important issue for surface mounted device (SMD) inductors manufacturers. SMD components easily damage the phenomenon of the electrode, and the brightness of the brightness of the damaged area of the electrode close to normal, not easy to be precise defect area separated from the electrode area.

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Periodical:

Applied Mechanics and Materials (Volumes 635-637)

Pages:

989-992

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.635-637.989

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Online since:

September 2014

Authors:

Chun Li Chang, Wen Hong Wu*, Rui Cian Weng, Chi Hung Hwang

Keywords:

Automation Optical Inspection (AOI), High Frequency Inductors, Illumination, Texture Analysis

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* - Corresponding Author

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