Intelligent Four-Probe Resistivity Meter Based on MCU

Jian Zhen Huo

doi:10.4028/www.scientific.net/AMM.644-650.3552

Paper Titles

Charge and Discharge Protection Circuit of a Mobile Power Supply Improvement
p.3534

Risk Assessment of Power Transformer Life Cycle Cost Based on Extensible Matter-Element Model
p.3538

A New Method for Power System Transient Stability Assessment: Application of Adaptive Combined Classifiers
p.3542

Influence of Moisture on the Space Charge Migration and Electric Field Behavior in Oil-Paper Insulation
p.3548

Intelligent Four-Probe Resistivity Meter Based on MCU
p.3552

Routing Selection for Communication of Power System Wide-Area Protection Considering Backup Path
p.3556

A Novel Broadband Vibration Energy Harvester
p.3560

Equivalent Circuit of a Planar Transformer Used for TWTA
p.3564

A Reconfigurable Radix-r FFT Hardware Structure Design
p.3568

HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 644-650Intelligent Four-Probe Resistivity Meter Based on...

Intelligent Four-Probe Resistivity Meter Based on MCU

Abstract:

Resistivity is an important parameter to determine the electrical properties of semiconductor materials, which can be obtained from four-probe measurement to get the doping concentration and other important information. This paper gives an introduction of an intelligent DC four-probe meter based on Micro-Controller Unit (MCU), including the principle, the overall framework and the function of each module. The design of hardware and software of the system are described. This instrument has the advantages of miniature size, modular structure, strong anti-interference ability and low power consumption.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Applied Mechanics and Materials (Volumes 644-650)

Pages:

3552-3555

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.644-650.3552

Citation:

Cite this paper

Online since:

September 2014

Authors:

Jian Zhen Huo*

Keywords:

AD7706, AT89S52, Constant Current Source, Four-Probe Meter, Serial Communication

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

* - Corresponding Author

References

[1] J.S. Kilby: Invention of the integrated circuit (IEEE Transactions on Electron Devices, 1976).

Google Scholar

[2] Keithley: Plan Canada Vol. 41(2002), p.56.

Google Scholar

[3] Z.L. Yang: Integrated circuit introduction (Tsinghua University press, Beijing 2003).

Google Scholar

[4] L.J. Van der Pauw: Philips Res. Rep., Vol. 13 (1958), p.1.

Google Scholar

[5] B. Karbeyaz, N. Gençer. IEEE Transactions on Medical Imaging Vol. 22 (2003), p.627.

Google Scholar

[6] Y. Masato, N. Toshifumi, I. Atsushi, K. Hiroshi, T. Nobuo. Japan Journal of Applied Physics. Vol. 32 (1993), p.246.

Google Scholar

[7] M. Borage, S. Tiwari, S. Kotaiah: Industrial Electronics IEEE T. Vol. 54 (2007), p.741.

Google Scholar

[8] E.J. van der Zwan, K. Philips, C. A. A. Bastiaansen: IEEE J. Solid-State Circuits, Vol. 35 (2000), p.1810.

Google Scholar

[9] W.W. Mi, F. Yang, L. Xu: Electronic test (2012), p.65 (In Chinese).

Google Scholar

[10] J. A. E. P. van Engelen, R. J. van de Plassche, E. Stikvoort, A.G. Venes: IEEE J. Solid-State Circuits, vol. 34 (1999), p.1753.

DOI: 10.1109/4.808900

Google Scholar