Research on the Feature Parameter Extraction of Wheat Seeds’ Bad Point Based on Image Processing

Zhe Wen; Qian Dong; Jie Zhu; Ya Bin Fan

doi:10.4028/www.scientific.net/AMM.644-650.4140

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vols. 644-650Research on the Feature Parameter Extraction of...

Research on the Feature Parameter Extraction of Wheat Seeds’ Bad Point Based on Image Processing

Abstract:

It is very important that study the feature parameter extraction of bad point of wheat seeds based on image processing for judging the quality of wheat. Using image processing extract and analyze the collected images information, and based on the collected information analyze the bad point information of wheat seed, then extract the feature parameters. Traditional bad point’s feature extraction methods are completed by the manual operation, and the efficient is lower. Currently, by means of image processing technology can extract the bad point’s feature of wheat seed automatically. To this end, the research status of seed feature extraction based on image processing are reviewed and prospected. Experiments show that the method can better complete the bad point’s feature automatic extraction and recognition of wheat seeds.

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Periodical:

Applied Mechanics and Materials (Volumes 644-650)

Pages:

4140-4143

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.644-650.4140

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Online since:

September 2014

Authors:

Zhe Wen*, Qian Dong, Jie Zhu, Ya Bin Fan

Keywords:

Bad Point’s Feature Extraction, Image Processing, Recognition

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