A New Calibration Method for Backscatter Signal in a Side Beam X-Ray Detection System

Jia Min Chen; Wei  Jiao Li; Tian Ming Shen; Qing Qing Chang

doi:10.4028/www.scientific.net/AMM.666.288

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 666A New Calibration Method for Backscatter Signal in...

A New Calibration Method for Backscatter Signal in a Side Beam X-Ray Detection System

Abstract:

This paper shows a method to calibrating the non-uniformity of the x-ray backscatter image in a side-beam x-ray detection system. The flying spot of x-ray beam cross the luggage under detection per cycle, and every point of the detector being irradiated by flying spot can be taken as an assumed detector. Using calibrators of different thickness and combined with the corresponding mathematical model, the greyscale of the image is uniformed and calibration is achieved.

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Periodical:

Applied Mechanics and Materials (Volume 666)

Pages:

288-292

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.666.288

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Online since:

October 2014

Authors:

Jia Min Chen*, Wei Jiao Li, Tian Ming Shen, Qing Qing Chang

Keywords:

Calibration, Detector Response, Non-Uniform, Side Beam, X-Ray Backscatter

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* - Corresponding Author

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