Single Event Effects Testing of Xilinx Zynq-7010 SoC with ²³⁹Pu Alpha Irradiation

Abstract:

Estimating the radiation sensitivity and radiation response of individual electronic units embedded in System on chip (SoC) is important for SoC error rate predicting and fault tolerant system designing. In this paper, the experimental techniques for detecting the single event effects (SEE) of SoC were introduced. The test system has been established and the irradiation experiments have been performed for testing SEE of Xilinx Zynq-7010 SoC with ²³⁹Pu alpha radiation source. Several single events functional Interrupt (SEFI) of some typical registers within the SoC sample were detected after receiving the total fluence of 6.101. In the end, the mechanisms of SEFI induced by alpha irradiation on SoC were discussed and analyzed.

• Periodical: Applied Mechanics and Materials (Volume 678)
• Pages: 268-273
• DOI: https://doi.org/10.4028/www.scientific.net/AMM.678.268
• Online since: October 2014
• Authors: Xue Cheng Du, Shu Huan Liu*, Chao Hui He, Xin Du, Yong Hong Li, Yao Zhang, Wei Chen, Xin Zan Liu, Dong Sheng He
• Keywords: Single Event Effects (SEE), Single Event Functional Interrupt (SEFI), System on Chip (SoC)

References

[1] K. Wakabayasbi and T. Okamoto: IEEE Trans. on Computer-Aided Design of Integrated Circuits and Systems Vol. 19 (2000), P 1507- 1522.

[2] Information on http: /en. wikipedia. org/wiki/System_on_a_chip.

[3] D. Hiemstra and A. Baril: IEEE Trans. Nucl. Sci. Vol. 46 (1999), p.1453–1460.

[4] D. White: Considerations surrounding single event effects in FPGAs, ASICs, and processors, XAPP402 (v1. 01), Xilinx Corp., (2012).

[5] Guerin, S. M: FY11 End of Year Report NEPP SOC Devices (JPL Publications, Pasadena 2012).

[6] Irom, F: Guideline for Ground Radiation Testing of Microprocessors in the Space Radiation Environment, (JPL Publication, Pasadena 2008).

[7] J.H. Elder, et al.: IEEE Trans. Nucl. Sci. Vol. 43(1988), pp.1678-1681.

[8] J.W. Howard Jr. et al.: Total Dose and Single Effects Testing of the Intel Pentium (P3) and AMD K7 Microprocessors, IEEE Radiation Effects Data Workshop, (2001), pp.38-47.

DOI: 10.1109/redw.2001.960446

[9] F. Bezerra, J. Kuitunen: Analysis of the SEU behavior of PowerPC603R under heavy ions, Radiation and Its Effects on Components and Systems, Proceedings of the 7th European Conference on, (2003), pp.289-293.

[10] Information on http: /www. zedboard. org/content/microzed-0.

[11] Xilinx. Inc. Zynq-7000 All Programmable SoC Technical Reference Manual, UG585, (2013. 9).

[12] Information on http: /www. origin. xilinx-china. com/products/silicon-devices/soc/index. htm.