Parallel Measurement Based on Laue Effect

Article Preview

Abstract:

In the paper, interference measurement method for end surface parallel measurement of transparent materials is described. Firstly, basic principles of optical plane template equilibrium point detection are analyzed, measurement algorithms and formulas for calculating optical parallelism are proposed, then possible error of algorithm is analyzed in details, concrete plan for correcting the error is proposed, overall method for testing parallelism is proposed on the basis, and finally related experiment is designed for testing and analyzing the method. Test results show that the method can prominently improve precision of testing parallelism with excellent testing effect.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

928-931

Citation:

Online since:

December 2014

Authors:

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2015 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Wang. L, Qian.H. L: Journal of Software Vol. 14 (2003), p.1635−1644.

Google Scholar

[2] Zhang. J, Gong. J : Computer Science Vol. 30 (2003), p.155−166.

Google Scholar

[3] M.A. Green: High Efficiency Silicon Solar Cells (Trans Tech Publications, Switzerland 2005).

Google Scholar

[4] WANG .J. Q, JIN. G,YANG.C. X: Optics and Precision Engineering Vol. 12(2005), pp.105-116.

Google Scholar

[5] CHANG. S, CAO .Y. P, CHEN. Y. Q: Optical Instruments Vol. 27(2005), pp.12-16.

Google Scholar

[6] CHEN. X, WANG Y. F, FAN . D: Journal of Applied Optics Vol. 23(2002), pp.46-48.

Google Scholar

[7] JUN . C: Cloud light technology Vol. 35(2003), pp.1-6.

Google Scholar