Nano-Contact Force Calculation Method of Different Tip Radius of Curvature and the Specimen Surface of AFM

Guo Dong Cheng; Xiao Jing Yang

doi:10.4028/www.scientific.net/AMM.723.952

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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 723Nano-Contact Force Calculation Method of Different...

Nano-Contact Force Calculation Method of Different Tip Radius of Curvature and the Specimen Surface of AFM

Abstract:

Atomic Force Microscope (AFM) works by the force between the probe tip and specimen surface. The nanocontact force between the probe tip and specimen surface has an important influence on the detection surface. Base on the analysis of the working principle of the AFM and nanocontact force calculation model, according to Hamaker assumptions, using continuum method established the theoretical contact force model of the AFM tip. the contact force calculation methods of contact pressure in process has been obtained. The variation of the force between the probe tip and specimen surface has been found by calculation model and programming calculation of Matlab. Provide the basis for improving the accuracy of an atomic force microscope surface inspection and error analysis

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Periodical:

Applied Mechanics and Materials (Volume 723)

Pages:

952-957

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.723.952

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Online since:

January 2015

Authors:

Guo Dong Cheng, Xiao Jing Yang*

Keywords:

AFM, Nano-Contact Force, Probe, Tip Curvature Radius

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References

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