Preparation and Properties of Graphene/TiO2 Thin Films

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This study prepared a Graphene/TiO2(G/TiO2) thin films by using a sol–gel method The structure and morphology of the materials were characterized using X-ray diffraction (XRD), atomic force microscope (AFM) and thermo gravimetric- differential scanning calorimeter techniques (TG/DTG).AFM images showed that the G/TiO2 film is typically amorphous hot-treated at 300°C. When the temperature was increased to 500 °C, G/TiO2 thin films are all crystalline. The XRD results showed that G/TiO2 thin films contained crystalline phase of anatase after calcining at 500°C. TG/DTG measurement showed that the change of the crystal phase did not occur in gel until to 500°C.

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136-139

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July 2015

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© 2015 Trans Tech Publications Ltd. All Rights Reserved

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