Characterization and Optical Properties of Zinc Oxide Films Prepared by Microwave Technique

Suparut Narksitipan; Thaweedet Awirut

doi:10.4028/www.scientific.net/AMM.804.7

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Characterization and Optical Properties of Zinc Oxide Films Prepared by Microwave Technique
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HomeApplied Mechanics and MaterialsApplied Mechanics and Materials Vol. 804Characterization and Optical Properties of Zinc...

Characterization and Optical Properties of Zinc Oxide Films Prepared by Microwave Technique

Abstract:

In this research, zinc oxide (ZnO) films were prepared using a wet chemical reaction via a microwave technique. X-ray diffraction techniques (XRD) and energy dispersive x-ray spectroscopy (EDS) were used to study the phases, crystalline structures, chemical compositions and optical properties of the films, respectively. Optical transmittance was also measured through UV-VIS spectroscopy. Surface film morphologies were investigated by scanning electron microscopy (SEM). As a result, a ZnO phase with a hexagonal structure was detected. The EDS spectrum shows that elements of Zn and O were present. The average optical transmittance value for all films was 75% at a wavelength of 370-375 nm, a comparison among the films obtained at different times show a transmittance value slightly higher for films obtained at higher times. A calculation of the energy band gap of ZnO films was estimated to be in the range of 3.31 to 3.35 eV. Additional, the ZnO films showed a smooth surface.

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Periodical:

Applied Mechanics and Materials (Volume 804)

Pages:

7-11

DOI:

https://doi.org/10.4028/www.scientific.net/AMM.804.7

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Online since:

October 2015

Authors:

Suparut Narksitipan*, Thaweedet Awirut

Keywords:

Microwave Technique, Optical Properties, ZnO Films

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