Performance Analysis of Dual Vt Domino Circuits with P-V-T Variations
The leakage current, active power and delay characterizations of the domino circuits in the presence of P-V-T (Process, Voltage, and Temperature) variations are analyzed based on multiple-parameter Monte Carlo method. It is demonstrated that failing to account for P-V-T variations and process-electro-thermal couplings can result in significant inaccuracy in transistor-level performance estimation. It also indicates that under significant P-V-T variations, DTV (Dual Vt Technology) is still highly effective to reduce the leakage current and active power for domino circuits, but induces speed penalty. At last, the robustness of different domino circuits with DTV against the P-V-T variations is discussed.
Xingui He, Ertian Hua, Yun Lin and Xiaozhu Liu
J. H. Wang et al., "Performance Analysis of Dual Vt Domino Circuits with P-V-T Variations", Applied Mechanics and Materials, Vols. 88-89, pp. 326-330, 2011