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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 1-2Influence of Thermal Annealing Atmosphere on...

Influence of Thermal Annealing Atmosphere on Electrical Properties of Polycrystalline Silicon Grain Boundaries

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Physical Chemistry of Solid State Materials

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Periodical:

Advanced Materials Research (Volumes 1-2)

Pages:

399-404

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1-2.399

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Online since:

September 1994

Authors:

N. M'Gafad, H. Amzil, B.M. Semega, D. Sayah

Keywords:

Grain Boundary, Interface State Distribution, Polycrystalline Silicon

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© 1994 Trans Tech Publications Ltd. All Rights Reserved

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