Study on the Improved Recession Binary Tree Algorithm

Gui Hua Yang; Jun Chi Ma; Lian Cui; Yu Kai Gao; Chun Yu Xiong

doi:10.4028/www.scientific.net/AMR.1006-1007.1076

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 1006-1007Study on the Improved Recession Binary Tree...

Study on the Improved Recession Binary Tree Algorithm

Abstract:

Tag collision problems seriously affected the performance of the RFID system. In order to solve this problem, we proposed an improved Recession Binary Tree Algorithm to avoid duplication and redundancy search, so that system throughput can substantial increased in the case of there have large quantities of labels.

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Periodical:

Advanced Materials Research (Volumes 1006-1007)

Pages:

1076-1079

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1006-1007.1076

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Online since:

August 2014

Authors:

Gui Hua Yang, Jun Chi Ma, Lian Cui, Yu Kai Gao, Chun Yu Xiong

Keywords:

Binary Tree Algorithm, RFID, Throughput Rate

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References

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