Reliability Analysis for One-Shot Product with Weibull Lifetime Components ─ An Empirical Study

Chung Chu Pan; Yan Wang; Zai Bo Chen

doi:10.4028/www.scientific.net/AMR.1006-1007.481

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 1006-1007Reliability Analysis for One-Shot Product with...

Reliability Analysis for One-Shot Product with Weibull Lifetime Components ─ An Empirical Study

Abstract:

When the device is inspected only once, there are only two possible statuses either functioning or failed at the time of inspection. In this paper, we consider a series system consisting of two components with lifetimes following weibull distributions and a competing risks model is used to study the series system for quantal-response data. Based on the quantal-response data, the maximum likelihood estimates of parameters of weibull distribution are derived. The model is illustrated using a practical numerical example of two-component series products, and the statistical properties of the maximum likelihood estimators were studied via Monte Carlo simulation under three-stage inspected scheme for various sampling sizes. This study verified that the model is practical. This research results can be applied to the reliability analysis of one-shot products with Weibull components lifetime distribution and the stockpile storage performance test.

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Periodical:

Advanced Materials Research (Volumes 1006-1007)

Pages:

481-485

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1006-1007.481

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Online since:

August 2014

Authors:

Chung Chu Pan*, Yan Wang, Zai Bo Chen

Keywords:

Competing Risks Model, Maximum Likelihood Estimator, Quantal-Response Data, Weibull Distribution

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