Effect of Radiation Induced Charge Neutralization on ELDRS

V.S. Pershenkov; A.S. Bakerenkov; A.T. Yastrebov; A.V. Solomatin; V.V. Belyakov; V.V. Shurenkov

doi:10.4028/www.scientific.net/AMR.1016.478

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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1016Effect of Radiation Induced Charge Neutralization...

Effect of Radiation Induced Charge Neutralization on ELDRS

Abstract:

The physical model, procedure of fitting parameter extraction and experimental study of the contribution of radiation induced charge neutralization (RICN) effect on enhanced low dose rate sensitivity (ELDRS) of bipolar devices are presented.

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Periodical:

Advanced Materials Research (Volume 1016)

Pages:

478-483

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1016.478

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Online since:

August 2014

Authors:

V.S. Pershenkov*, A.S. Bakerenkov, A.T. Yastrebov, A.V. Solomatin, V.V. Belyakov, V.V. Shurenkov

Keywords:

Conversion Model, ELDRS, Fitting Parameters, Interface Trap, RICN

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References

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