Crystallization Stability of Sb2O3 -Doped Vanadium Phosphate Sealing Glass Analyzed by XPS

Xu Yang Zhang; Wen Qi He; Cheng Li; Hong Jiang; Chang Jiu Li; Lin Yu; Yang Shen

doi:10.4028/www.scientific.net/AMR.1030-1032.43

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 1030-1032Crystallization Stability of Sb2O3 -Doped Vanadium...

Crystallization Stability of Sb₂O₃-Doped Vanadium Phosphate Sealing Glass Analyzed by XPS

Abstract:

The mechanism of the increased crystallization stability (the difference between glass incipient crystallization temperature and transition temperature) of Sb₂O₃ —doped vanadium phosphate sealing glass investigated by X-ray photoelectron spectroscopy (XPS) is reported in the present study. Experimental results showed that after doping with Sb₂O₃, the rate of bridging oxygen increased while the rate of no-bridging oxygen decreased, and the ratio of V⁴⁺/V_total also increased, too. This two changes led to the break of V=0 bond which is essential for the formation of V₂O₅ crystalline phase, thus inhibited the formation of that crystalline phase and improved glass crystallization stability.

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Periodical:

Advanced Materials Research (Volumes 1030-1032)

Pages:

43-47

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1030-1032.43

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Online since:

September 2014

Authors:

Xu Yang Zhang*, Wen Qi He, Cheng Li, Hong Jiang, Chang Jiu Li, Lin Yu, Yang Shen

Keywords:

Crystallization Stability, Sb₂O₃, Vanadium Phosphate Glass, XPS

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