Peak Diffusing Measurement Method for Estimating Thermal Diffusivity of Thin Films

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A novel peak diffusing measurement method is reported. In this method, a pulsed Gaussian heat source is focused on the material’s surface, and a thermal camera is utilized for detecting the temperature evolution. Specially, the peak temperature time tmax at different distance from the heat source center is extracted using the Singular Spectrum Analysis (SSA). Thermal diffusivity is then calculated by fitting multiple sets of extracted tmax into the derived regression equation. The advantage of this method is that it does not require the high precision time synchronization between the excitation source and detector. Also, the calculation process is very simple, which achieves an efficient in situ measurement of the thermal diffusivity. The measured radial thermal diffusivity of samples prepared from Ti and Ni is in good agreement with the reference data with a 1.8% and a 3.9% error bound.

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Edited by:

Ping Chen

Pages:

166-172

Citation:

H. L. Dong et al., "Peak Diffusing Measurement Method for Estimating Thermal Diffusivity of Thin Films", Advanced Materials Research, Vol. 1035, pp. 166-172, 2014

Online since:

October 2014

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$41.00

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