Design and Realization of Intelligent Electrical Resistivity Measurement System

Article Preview

Abstract:

Based on graphic program language LabVIEW and Micro Control Unit MSP430F169, an intelligent electrical resistivity measurement system with four-point probe and four-line was studied in this paper. Structured Query Language of LabVIEW was applied for calibration and management in database. Hardware feedback and software compensation technologies were designed in high-precision current source, whose range was automatic selected in auto-mode. Between the computer program and hardware control unit controlled by MCU, a RS-232 data communication protocol was applied in order to improve the ability of human-machine interaction and automation degree. Experiment results in semiconductor and metal material science indicated that the measurement system measured accurately and automotive, the information database of the tested material was the foundation of data analyzing and data mining.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

210-216

Citation:

Online since:

October 2014

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2014 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

* - Corresponding Author

[1] Dinesh Varshney, Neha Dodiya. Electrical resistivity of alkali metal doped manganites LaxAyMnwO3(A=Na, K, Rb): Role of electronephonon, electroneelectron and electronemagnon interactions. Current Applied Physics , 2013 : 1-11.

DOI: 10.1016/j.cap.2013.03.030

Google Scholar

[2] Hai Jin Li, Xiao Ying Qin, Yi Liu, etal. Jin Lian HucResistivity, thermopower, and thermal conductivity of nickel doped compounds Cr1−xNixSb2 at low temperatures. Journal of Alloys and Compounds, 2011, 509: 3677-3681.

DOI: 10.1016/j.jallcom.2010.12.159

Google Scholar

[3] Zhang Jianke, Shi Fanglu. Measuring and Investigating of Low Temperature Resistivity of Ni-Ti Memory Alloy. Aerospace Materials & Technology, 1992. 5: 42-47.

Google Scholar

[4] Yan Min, Peng Chuwu, Li Fuhai, et al. Design of Intelligent Four-Point Probe Meter. Journal of Hunan University, 2005, 32(5): 52-55.

Google Scholar

[5] Lu Weihua, Zou Jijun. Design of Intelligent Four-Point Probe Meter Based on AD7705 and MCU. The application of electronic components, 2009, 11(12): 21-25.

Google Scholar

[6] Guo Zilan, A.M. STRYDOM. New-Designed Instrumentation of Low Temperature Resistivity Measurement by the Principle of Four-Point Probe Method. Research and Exploration in Laboratory, 2010, 29(11): 34-37.

Google Scholar

[7] Lu Xiaoming, Su Changhou. Measurement of the Resistivity of Si Wafers Using Double-Configuration Four-Point Probe. Microelectronics, 1994, 03: 60- 63.

Google Scholar

[8] Li Jianchang, Wang Yong, Wang Dan, et al. Progress of the Four-Probe Technique for Semiconductor Conductivity Characterization.

Google Scholar

[9] Su Changhou, Lu Xiaoming. Research on Measurement of Semiconductor Resistivity Using Double-Configuration Method. Journal of Semiconductors, 2004, 24(3): 298-305.

Google Scholar

[10] Su Changhou, Lu Xiaoming. Discuss Correction of Thickness for Measuring Resistivity of Semiconductor with Four-Point Probe Method. Measurement Technique, 2005, 8: 5-7.

Google Scholar

[11] GB/T 3048. 2-94 China Standard Book Number.

Google Scholar

[12] Tang Bo, Pan Hongbing, Zhao Yishun, et al. Realization of Database System Based on ADO and SQL in LabVIEW Environment. Chinese Journal of Scientific Instrument, 2007, 28(4): 227-229.

Google Scholar

[13] Chen Xianbiao, Lai Lieen. Design and Realization of Motor Performance Testing Database. Micro-motor, 2001, 34(1): 37-38.

Google Scholar

[14] Yoshihiro Terada, Kenji Ohkubo, Tetsuo Mohri, Tomoo Suzuki, Thermal conductivity in Pt-based alloys, Journal of Alloys and Compounds 285 (1999) 233-237.

DOI: 10.1016/s0925-8388(98)01042-1

Google Scholar

[15] Liu Zhicun. Key Technology to Measure Micro-Resistance. Physics Examination and Testing, 2005, 23(1): 34-36.

Google Scholar

[16] Compiled by Xu Aijun. Principle and Design of Intelligent Measurement and Control Instrumentation [M]. Beijing: Beihang University Press, 1995: 330-333.

Google Scholar

[17] Compiled by Lian Fazeng. Physical Properties of Materials [M]. Shenyang: Northeastern University Press, 2005: 113.

Google Scholar

[18] Wang Tianfei, Huang Yuanti. Internal Friction, Electric Resistance and Shape Change in Cu_Zn Alloy during Martensitic Transformation. Journal of University of Science and Technology Beijing, 1991, 13, 2: 169-172.

Google Scholar

[19] B.V. Reddy, S.C. Deevi. Thermophysical properties of FeAl (Fe-40 at. %Al). Intermetallics, 2000 (8) : 1369-1376.

DOI: 10.1016/s0966-9795(00)00084-4

Google Scholar

[20] Frank D. Stacey, Orson L. Anderson. Electrical and thermal conductivities of Fe-Ni-Si alloy under core conditions. Physics of the Earth and Planetary Interiors, 2001 (124) : 153-162.

DOI: 10.1016/s0031-9201(01)00186-8

Google Scholar