Reliability Analysis of Mobile Phones’ Acoustic Dust-Proof Mesh against Contaminated Environment

Abstract:

Dust particles and organic contaminants in environment can intrude into electronic device interior through the shell and opening holes. The intrusive contaminants can adhere on electric contact interface. Therefore, it can reduce components’ electric connection reliability. Widely it used acoustic dust-proof mesh to protect the mobile phone and other electric devices’ earpieces and speakers from contamination intrusion. This preventing contamination role makes much dust particles and organics adhere on the mesh. It is necessary to evaluate dust-proof mesh ability against contamination. In this paper, actual field contaminated meshes have been taken failure analysis. Then, lab simulation experiments have been established with considering meshes and contaminants’ characters. Finally the influence of mesh’s parameter on contamination has been researched.

• Periodical: Advanced Materials Research (Volumes 1049-1050)
• Pages: 802-805
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.1049-1050.802
• Online since: October 2014
• Authors: Yang Lv*, Liang Jun Xu, Zhi Gang Kong, Li Zhang
• Keywords: Contaminated Environment, Dust-Proof Mesh, Electric Reliability

References

[1] Jigao Zhang, A Summary Report on the Mechanism of Electric Contact Failure due to Particle Contamination , 57th IEEE Holm Conf. on E.C., USA. (2011).

DOI: 10.1109/holm.2011.6034803

[2] Yilin Zhou, Yang Lv, Electrical Contact Behavior of Several Typical Materials in Dust at Static and Dynamic Conditions, 56th IEEE Holm Conf. on E.C., Vancouver, Canada. Otc. 4-7, (2010).

DOI: 10.1109/holm.2010.5619469

[3] Yilin Zhou, Yang Lv, The Influence of the Organic Compounds on the Contaminated Electrical Contacts , ICEC (2012).

[4] J.G. Zhang, J.C. Gao, C.F. Feng, Adhesion and Attaching of Particles at the Failed Connector Contacts , 23rd International Conference of Electrical Contacts, (2006).

[5] Y.N. Liang, J.G. Zhang, J.J. Liu, Identification of Inorganic Compounds in Dust Collected in Beijing and Their Effects on Electric Contacts , Proc. of 43rd IEEE Holm Conference on Electric Contacts , 1997. 315-327.

DOI: 10.1109/holm.1997.638057