Testing Level Measurement Devices by Imitating Sensor Signals

Maxim Polenov; Vyacheslav Guzik; Andrey Dodonov

doi:10.4028/www.scientific.net/AMR.1083.178

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Simulation Analysis of the Multi-Parameter Influence on FBG Peak Reflectivity
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Influence of Transformer Rated Secondary Load Differences on Electric Energy Metering
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Testing Level Measurement Devices by Imitating Sensor Signals
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IV-Characteristics Measurement Error Resulting from Long Cables for Irradiated Bipolar Junction Transistors
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1083Testing Level Measurement Devices by Imitating...

Testing Level Measurement Devices by Imitating Sensor Signals

Abstract:

Testing of level measurement devices is a very important process. Many of these devices use electric signals acquired from sensor modules in real environment. That is why throughout this paper a concept and correspondent tool for artificial synthesizing and replaying of such signals is developed. Benefits of the work include new possibilities for testing devices in more realistic conditions with controlled arbitrary sensor input, demonstrating level measurement process without actual environment and improving process of educating the personal by simplifying the learning curve of device functionality and level recognition algorithms.

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Periodical:

Advanced Materials Research (Volume 1083)

Pages:

178-184

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1083.178

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Cite this paper

Online since:

January 2015

Authors:

Maxim Polenov*, Vyacheslav Guzik, Andrey Dodonov

Keywords:

Envelope Curve, Level Measurement Device, Synthetic Signal, Testing

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* - Corresponding Author

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