Using Methods of Multi Scale Modeling for Investigation of Sample Defects

Aleksandr Dubinets; Evgeny Vladislavovich Pustovalov; Evgeny B. Modin; Aleksandr N. Fedorets; Vladimir S. Plotnikov

doi:10.4028/www.scientific.net/AMR.1088.814

Paper Titles

Energy Saving for Distillation Process of Mixture with Wide-Boiling Range via T-Q Graph
p.792

The Influence of the Welding Current Polarity on the Geometric Configuration of the Bead
p.797

Simulation of Drying Hevea brasiliensis Wood
p.802

The Influence of Welding Parameters on Heat Transfer Efficiency of Hybrid Pulsed Nd: YAG/GTAW Welding
p.807

Using Methods of Multi Scale Modeling for Investigation of Sample Defects
p.814

A Study on Image Processing Algorithms for Seam Tracking System in GMA Welding
p.819

A Study on Modified Hough Algorithm for Image Processing in Weld Seam Tracking System
p.824

Affect of Casing Eccentricity on Stress at the Cement Ring Interface
p.829

Simulation of Temperature Field in the Solidification Process of Cast
p.834

HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 1088Using Methods of Multi Scale Modeling for...

Using Methods of Multi Scale Modeling for Investigation of Sample Defects

Abstract:

In this paper we consider using multi scale modeling methods for reproduce structural and composite defects of amorphous metal alloys for quality improvement to improve process of getting information from experimental electron microscopic images. We used amorphous metal alloys with known structural defects as a studying objects. Also for this objects were generated models, which were designed for simulating real defects. For final model there was calculated the electron microscope images, which then was compared to the experimentally obtained one, after that were made conclusions about similarity of the real defect and the modeled one.

You might also be interested in these eBooks

View Preview

Info:

Periodical:

Advanced Materials Research (Volume 1088)

Pages:

814-818

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.1088.814

Citation:

Cite this paper

Online since:

February 2015

Authors:

Aleksandr Dubinets, Evgeny Vladislavovich Pustovalov, Evgeny B. Modin, Aleksandr N. Fedorets, Vladimir S. Plotnikov

Keywords:

Electron Microscopy, Image Simulation, Multi-Scale Modeling

Export:

RIS, BibTeX

Price:

Permissions CCC:

Request Permissions

Permissions PLS:

Request Permissions

Сopyright:

Citation:

References

[1] D.A. Muller, L.F. Kourkoutis, M. Murfitt, J.H. Song, H.Y. Hwang, J. Silcox, N. Dellby, O.L. Krivanek, Science 319 (2008) 1073.

DOI: 10.1126/science.1148820

Google Scholar

[2] S. Hofmann, R. Sharma, C. Ducati, G. Du, C. Mattevi, C. Cepek, M. Cantoro, S. Pisana, A. Parvez, F. Cervantes-Sodi, A.C. Ferrari, R. Dunin-Borkowski, S. Lizzit, L. Petaccia, A. Goldoni, J. Robertson, Nano Lett. 7 (2007) 602.

DOI: 10.1021/nl0624824

Google Scholar

[3] Mark L. Miller, Rodney C. Ewing Ultramicroscopy 48 (1993) 203–237.

Google Scholar

[4] Earl J. Kirkland. Advanced Computing in Electron Microscopy. 2010. p.289.

Google Scholar

[5] E. Pustovalov, E. Modin, O. Voitenko, A. Fedorets, A. Dubinets, B. Grudin, V. Plotnikov, S. Grabchikov, Nanoscale Research Letters 2014, 9: 66.

DOI: 10.1186/1556-276x-9-66

Google Scholar

[6] C. Dwyer , Ultramicroscopy 110 (2010) 195–198.

Google Scholar