A Modified Wavelet Transform Profilometry

Abstract:

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To overcome the noisy background comes from surface reflection, spectrum overlapping and dust noisy. In this paper, a novel modified continuous wavelet transform profilometry is proposed, which employs a fringe image and a flat image to eliminate the background. Both the fringe and flat pattern are projected onto the object by a projector. With the subtraction of the flat image from the fringe image, the background is completely removed and the spectrum overlapping in the frequency domain is prevented. Experimental results showed that the proposed method got a better result than the traditional CWT.

Info:

Periodical:

Edited by:

Dunwen Zuo, Hun Guo, Hongli Xu, Chun Su, Chunjie Liu and Weidong Jin

Pages:

140-143

DOI:

10.4028/www.scientific.net/AMR.136.140

Citation:

C. Y. Liu et al., "A Modified Wavelet Transform Profilometry", Advanced Materials Research, Vol. 136, pp. 140-143, 2010

Online since:

October 2010

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Price:

$35.00

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