A Modified Wavelet Transform Profilometry

Chun Yuan Liu; Bo Zhou; Xiao Min Zhao

doi:10.4028/www.scientific.net/AMR.136.140

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A Modified Wavelet Transform Profilometry
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 136A Modified Wavelet Transform Profilometry

A Modified Wavelet Transform Profilometry

Abstract:

To overcome the noisy background comes from surface reflection, spectrum overlapping and dust noisy. In this paper, a novel modified continuous wavelet transform profilometry is proposed, which employs a fringe image and a flat image to eliminate the background. Both the fringe and flat pattern are projected onto the object by a projector. With the subtraction of the flat image from the fringe image, the background is completely removed and the spectrum overlapping in the frequency domain is prevented. Experimental results showed that the proposed method got a better result than the traditional CWT.

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Periodical:

Advanced Materials Research (Volume 136)

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140-143

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.136.140

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Online since:

October 2010

Authors:

Chun Yuan Liu, Bo Zhou, Xiao Min Zhao

Keywords:

Flat Image, Fringe Image, Modified WTP

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References

[1] Jingang Zhong, Jiawen weng: Applied Optics, Vol. 43(2004), pp.4993-98.

Google Scholar

[2] Abdulbasit Z., Muther A. Gdeisat and David R. Burton: A Comparison between Wavelet Fringe Analysis Algorithms, Photo06 Conference, Manchester, UK(2006).

Google Scholar

[3] Liu Chunyuan, Zhou Bo: Journal of Heilongjiang Institute of Science and Technology Vol. 20(2010), pp.61-64.

Google Scholar

[4] Song Zhong: Optics and Lasers in Engineering Vol. 48(2010), pp.149-158.

Google Scholar

[5] Heng Liu, Alexander N. Cartwright, Cemal Basaran: Applied Optics, Vol. 43(2004), pp.850-57.

Google Scholar

[6] Dursun A., Ozder S. and Ecevit N.: Measurement Science and Technology Vol. 15(2004), pp.1768-1772 x/pixel y/pixel Phase/radians pixel pixel pixel pixel.

DOI: 10.51903/pixel.v15i2

Google Scholar