Low-Cost Optical Measurement for Micro-Displacement with High Accuracy

Article Preview

Abstract:

Micro-displacement measurement with high accuracy plays a vital role in micro/nano manufacturing technology. In this paper, three low-cost techniques for micro-displacement measurement with high accuracy are discussed, and they are the methods based on DVD optical head, burred images and stop-action images. The techniques based on the DVD optical head and burred images are very attractive for many applications where the low cost is indispensable, and the method based on stop-action images has also better performance when measuring the static micro-displacement. Then, an application based on the stop-action images approach is given, and this method can measure the micro-displacement with nanometer accuracy. In addition, these discussions show that the methods based on the DVD optical head and burred images are a possible direction for low-cost micro-displacement measurement with high accuracy.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 139-141)

Pages:

2042-2045

Citation:

Online since:

October 2010

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2010 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] T. Wang, X.D. Wang, L.D. Wang, et al.: China Mechanical Engineering, Vol. 16 (2005) No. 1, pp.83-88. (In Chinese).

Google Scholar

[2] C. H. Liu, W. Y. Jywe, Y. R. Jeng, et al.: Precision Engineering, Vol. 34 (2010), pp.497-506.

Google Scholar

[3] Y. Zhong, G. X. Zhang, C. L. Leng, et al.: Measurement, Vol. 40 (2007), pp.623-627.

Google Scholar

[4] C. Rembe, B. Tibken, E.P. Hofer: Journal of Microelectromechanical system, Vol. 10 (2001) No. 1, pp.137-145.

Google Scholar

[5] M. Kim, W. Moon, E. Yoon, et al.: Sensors and Actuators A, 130-131 (2006), pp.135-141.

Google Scholar

[6] S. Kostner, M. J. Vellekoop: Elektrotechnik & Informationstechnik, Vol. 125 (2008) No. 3, pp.98-101.

Google Scholar

[7] K. C. Fan, C. L. Chu, J. L. Liao, et al.: Meas. Sci. Technol, Vol. 14 (2003), pp.47-54.

Google Scholar

[8] K. C. Fan, C. L. Chu, J. I. Mou: Meas. Sci. Technol, Vol. 12 (2001), pp.2137-2146.

Google Scholar

[9] S. K. Kuo, C. C. Hung, C. C. Lin, et al.: Measurement, Vol. 40 (2007), pp.255-263.

Google Scholar

[10] B.Q. Guan, S.G. Wang, C. Liu: Chinese Journal of Mechanical Engineering, Vol. 20 (2007) No. 1, pp.77-81.

Google Scholar

[11] J. L, S.G. Wang: Journal of Shanghai Jiaotong University, Vol. 42 (2008) No. 2, pp.227-230.

Google Scholar

[12] Q. H. Lu, X.M. Zhang: Chinese Journal of Mechanical Engineering, Vol. 45 (2009) No. 2, pp.164-169. (In Chinese).

Google Scholar

[13] S. J. Timoner, D. M. Freeman: Opt. Eng, Vol. 40 (2001) No. 9), p.2003-(2016).

Google Scholar

[14] H. Wang, X.M. Zhang: Chinese Journal of Mechanical Engineering, Vol. 44 (2008) No. 10, pp.177-181. (In Chinese).

Google Scholar