A Study on Location Technology of Humsn Face Gradient Direction

Jai Yi Zhu; Yun Juan Liang; Li Li

doi:10.4028/www.scientific.net/AMR.143-144.841

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 143-144A Study on Location Technology of Humsn Face...

A Study on Location Technology of Humsn Face Gradient Direction

Abstract:

In this paper a face location technology based on gradient distributions is presented. It begins with vertical location by use of vertical integral projection on the two-valued image of the original image, and then proceeds with horizontal location according to the distributions of gradient direction. Experiments have proved this technology fast and efficient.

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Periodical:

Advanced Materials Research (Volumes 143-144)

Pages:

841-845

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.143-144.841

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Online since:

October 2010

Authors:

Jai Yi Zhu, Yun Juan Liang, Li Li

Keywords:

Face Recognition, Feature Recognition, Gradient Direction, Location

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