Study on Microstructure Characterization of Al-N Codoping ZnO Films and Doping Mechanism

Abstract:

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Al-N codoped ZnO thin films were prepared by sol-gel method, which microstructure were characterized by AFM and XPS, on the basis of the result, doping mechanism of Al-N co-doped thin film is: the formation of the first occurrence of Al was replacing doping system of Zn, and it is conducive for N element in the system to the solution along with the increasing of Al doping concentration.

Info:

Periodical:

Advanced Materials Research (Volumes 152-153)

Edited by:

Zhengyi Jiang, Jingtao Han and Xianghua Liu

Pages:

813-816

DOI:

10.4028/www.scientific.net/AMR.152-153.813

Citation:

Y. Xu et al., "Study on Microstructure Characterization of Al-N Codoping ZnO Films and Doping Mechanism", Advanced Materials Research, Vols. 152-153, pp. 813-816, 2011

Online since:

October 2010

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Price:

$35.00

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