SEM Analysis of Non-Conducting Materials under Low Vacuum Conditions

Zhi Gang Wang; Ke Gao Liu; Min Jing; Bo Pang

doi:10.4028/www.scientific.net/AMR.152-153.897

Paper Titles

Determination of Thickness for the Individual Layer of Strained P-Type Al_0.11Ga_0.89NGaN Superlattice by High Angle Annular Dark Field Scanning Transmission Electron Microscopy
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Wear Properties of Reaction Sintered B₄C Composites
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Vibration Emulating and Measuring of Pipe System Being Filled with Liquid Ammonia in Chemical Ship
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Test on the Mortar Mix Ratio with Aeolian Sand of Mu Us Desert
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SEM Analysis of Non-Conducting Materials under Low Vacuum Conditions
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Effect of Various Pretreatment Methods of Inoculum on Biohydrogen Production
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Prepared of Flower-Like CuO via CTAB-Assisted Hydrothermal Method
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Morphology of the Diamond Thin Films Grown by Microwave Plasma Chemical Vapor Deposition with Different Aftertreatments
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Optically Active Films Fabricated from Poly(Allylamine Hydrochloride) and R-(+)-1-Phenylethylamine Derivatives of Poly(Ethylene-Alt-Maleic Acid) with Different Degrees of Substitution
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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 152-153SEM Analysis of Non-Conducting Materials under Low...

SEM Analysis of Non-Conducting Materials under Low Vacuum Conditions

Abstract:

The surface morphology of the non-conducting granular materials was analysis by SEM under low vacuum conditions. The effects of the incident electron voltage, electronic beam spot size and atmosphere pressure on the SEM image quality and EDX analysis were investigated systematically. The results show that the quality and the resolution of the SEM images both reduce with the increase of the incident electron voltage, the electronic beam spot size and the atmosphere pressure; the errors of the EDS analysis decrease when measured under low vacuum conditions.