Research on the Characterization and the Properties of SiOx Coating on Plastic Film

Gai Mei Zhang; Qiang Chen; Cun Fu He; Hui Qin Zhu; Yu Ling Li

doi:10.4028/www.scientific.net/AMR.174.486

Paper Titles

Preparation of Self-Crosslinking Core-Shell Latex at Ambient Temperature
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Effect of Polyethylene Films Coated Capsaicin on Rodent Repellent
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RF Magnetron Sputtered SiO_x Coatings on Papers
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Development and Application of Intelligent Release Fresh-Keeping Composite Packaging Films
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Research on the Characterization and the Properties of SiO_x Coating on Plastic Film
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Study on Branched Polyacrylamide Preparation and Application
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Modified Polypropylene Filled with Nano-Al₂O₃
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Research in Compositions and Coloration Performance of Polyurethane Ink Absorption Coating
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Phase Transformation Conditions on the Structures and Properties of Cellulose Packaging Films in LiCl/DMAc
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HomeAdvanced Materials ResearchAdvanced Materials Research Vol. 174Research on the Characterization and the...

Research on the Characterization and the Properties of SiO_x Coating on Plastic Film

Abstract:

The nano-thickness SiOx deposited on polyethylene terephthalate (PET) film and biaxially oriented polypropylene (BOPP) were fabricated by plasma enhanced chemical vapor deposition (PECVD) in a radio frequency (13.56 MHz) glow discharge. The nano-coatings were characterized by using Fourier transform infrared spectroscopy (FTIR), atomic force microscopy (AFM) and ultrasonic atomic force microscopy (UAFM). With AFM and UAFM, the topography and ultrasonic amplitude images were obtained. In particular, the UAFM images reveal the subsurface defects in the coating. The tensile property, contact angle and OTR of the PET present and absent of the SiOx coating were investigated experimentally respectively. The results can show that the SiOx coating can improved the barrier and the tensile strength.

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Periodical:

Advanced Materials Research (Volume 174)

Pages:

486-489

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.174.486

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Online since:

December 2010

Authors:

Gai Mei Zhang, Qiang Chen, Cun Fu He, Hui Qin Zhu, Yu Ling Li

Keywords:

Barrier Property, Characterization, SiOx Film, Ultrasonic Atomic Force Microscopy

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