Application of COM/DCOM Based Multi-Layer Software Architecture in Measurement & Control Program

Xian Min Wei

doi:10.4028/www.scientific.net/AMR.179-180.824

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 179-180Application of COM/DCOM Based Multi-Layer Software...

Application of COM/DCOM Based Multi-Layer Software Architecture in Measurement & Control Program

Abstract:

Software architecture plays a more and more important role in measurement and control program design and development. It affects not only the progress of design and development, but also the gradual evolution potentiality of measurement and control system. This paper presents a COM/DCOM based N-layer software architecture and its usage in the design and development of the WFD2000 operating program. The application of this architecture greatly improves the reliability, configurability, flexibility and portability of the pressure measurement system.

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Periodical:

Advanced Materials Research (Volumes 179-180)

Pages:

824-829

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.179-180.824

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Online since:

January 2011

Authors:

Xian Min Wei

Keywords:

COM/DCOM, Control Software, Measurement, Software Architecture

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