Detection of Relevance between Long-Term Different Professional Training and Brain Development Using EEG

Abstract:

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To analyse the effects of long-term different professional training on brain development. First, EEG singals of 12 students are collected under thinking different mental tasks, after long-term different professional training. Second, to use DFT to extract frequency features and then use BP network and 10-fold cross validation to classify. The classification accuracy can amount to 90 percent around. The result indicates that EEG signals can change specially under special mental tasks, after long-term different professional training. It can reflect the different brain development patterns after different professional training directly.

Info:

Periodical:

Advanced Materials Research (Volumes 179-180)

Edited by:

Garry Zhu

Pages:

886-890

DOI:

10.4028/www.scientific.net/AMR.179-180.886

Citation:

L. L. Fan and W. Wang, "Detection of Relevance between Long-Term Different Professional Training and Brain Development Using EEG", Advanced Materials Research, Vols. 179-180, pp. 886-890, 2011

Online since:

January 2011

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Price:

$35.00

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