Detection of Relevance between Long-Term Different Professional Training and Brain Development Using EEG

Li Li Fan; Wei Wang

doi:10.4028/www.scientific.net/AMR.179-180.886

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 179-180Detection of Relevance between Long-Term Different...

Detection of Relevance between Long-Term Different Professional Training and Brain Development Using EEG

Abstract:

To analyse the effects of long-term different professional training on brain development. First, EEG singals of 12 students are collected under thinking different mental tasks, after long-term different professional training. Second, to use DFT to extract frequency features and then use BP network and 10-fold cross validation to classify. The classification accuracy can amount to 90 percent around. The result indicates that EEG signals can change specially under special mental tasks, after long-term different professional training. It can reflect the different brain development patterns after different professional training directly.

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Advanced Materials Research (Volumes 179-180)

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886-890

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.179-180.886

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Online since:

January 2011

Authors:

Li Li Fan, Wei Wang

Keywords:

BP Neural Network (BPNN), Brain Development, EEG, Professional Training

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