Modeling Fiber Point Diffraction with Vector Theory for FPDI Design

Article Preview

Abstract:

The fiber point diffraction technology has been used in fiber point diffraction interferometer (FPDI) to measure optical surface with high precision. The wavefront diffracted from the single mode fiber with microns core diameter can be considered as an ideal spherical wave and used as the referenced wave in interferometer. The absolute accuracy of the diffraction wavefront can not be directly measured in experiment. To estimate its quality, the vector diffraction method must be introduced because conventional scalar diffraction theory is unsuitable when the fiber core size is comparable to wavelength. The transfer mode feature which includes single-mode transmission condition and mode field distribution is analyzed at first. Then vector the model of fiber point diffraction is established. Finally, the diffraction wavefront is analyzed with numerical method based on vector theory, and the difference between scalar and vector method is discussed. The results show that vector model can achieve rigorous wavefront analysis for fiber point diffraction and provide important help for PFDI design.

You might also be interested in these eBooks

Info:

Periodical:

Pages:

658-662

Citation:

Online since:

February 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2011 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] K. Otaki, F. Bonneau, et al. Absolute Measurement of spherical surface by point diffraction interferometer. Proceedings of SPIE, 3740, pp.602-605 (1999).

Google Scholar

[2] R. N. Smartt and J. Strong. Point-diffraction interferometer. J. Opt. Soc. Amer, 62, pp.737-734 (1972).

Google Scholar

[3] Liu Guogang, Zhang Xuejun, et al. Fiber point diffraction interferometer. Optics and Precision Engineering, 9(2), pp.142-145 (2001).

Google Scholar

[4] Qian Gong, M. Geary, et al. Modeling point diffraction interferometers. Society of Photo-Optical Instrumentation Engineers, 35(2), pp.351-356 (1996).

Google Scholar

[5] Seung-Woo Kim, Byoung-Chang Kim, et al. Point-diffraction interferometer for 3-D profile measurement of rough surfaces. Proceedings of SPIE, 5191, pp.200-207 (2003).

Google Scholar

[6] K. Otaki, Y. Zhu, et al. Rigorous wavefront analysis of the visible light point diffraction interferometer for EUVL. Proceedings of SPIE, 5193, pp.182-190 (2004).

DOI: 10.1117/12.507046

Google Scholar