Statistical Process Control on Time Delay Feedback Adjustment Process

Abstract:

Control chart can be designed to quickly detect small shifts in the mean of a sequence of independent normal observations. But this chart cannot perform well for autocorrelated process. The main goal of this article is to suggest a control chart method using to monitoring process with different time delay feedback controlled processes. A quality control model based on delay feedback controlled processes is set up. And the calculating method of average run length of control charts based on process output and control action of multiple steps delay MMSE feedback controlled processes is provided to evaluate control charts performance. A simple example is used to illustrate the procedure of this approach.

• Periodical: Advanced Materials Research (Volumes 211-212)
• Pages: 305-309
• DOI: https://doi.org/10.4028/www.scientific.net/AMR.211-212.305
• Online since: February 2011
• Authors: Hai Yu Wang
• Keywords: Average Run Length, Feedback Adjustment, Statistical Process Control (SPC), Time Delay

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