Preparation and Characterization of FeS Film by Low Temperature Ion Sulfurizing Technique

Abstract:

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In this article, solid lubrication FeS film was prepared on the surface of AISI 1045 steel by means of low temperature ion sulfurizing process. Scanning electron microscopy (SEM) was utilized to observe the surface and cross-section morphologies of the sulfurized layer. The element distribution of the sulfurized layer surface was analyzed by X-ray energy spectrometer. The crystalline phases were determined by X-ray diffraction (XRD). X-ray stress determinator was utilized to measure the residual stress in the sulfurized layer. The nano-hardness and elastic modulus of the sulfurized layer were surveyed by a nano-indentation tester. The results showed that the surface of the FeS film was composed of many minute spherical particles with homogeneous grain size and distribution. The texture of the film was very loose with lots of micro-pores, and the crystallinity was well. There was compressive stress in the FeS film, and the stress value measured is -150 MPa. The average value of nano-hardness and elastic modulus were 4.02 GPa and 157.36 GPa respectively.

Info:

Periodical:

Advanced Materials Research (Volumes 217-218)

Edited by:

Zhou Mark

Pages:

1113-1116

DOI:

10.4028/www.scientific.net/AMR.217-218.1113

Citation:

J. J. Kang et al., "Preparation and Characterization of FeS Film by Low Temperature Ion Sulfurizing Technique", Advanced Materials Research, Vols. 217-218, pp. 1113-1116, 2011

Online since:

March 2011

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$35.00

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