Accurate and Fast Estimation of Optical Properties Using Optical Path Length and Spatially Resolved Reflectance Measurement

Abstract:

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We developed a new practical method for determining the absorption coefficient and reduced scattering coefficient simultaneously by using the spatial light intensity profile and the optical path length based on the results of a Monte Carlo simulation. The proposed system is optically and electrically robust and practical because (1) light intensity detection of a continuous wave for the spatially resolved reflectance is stable, convenient, and fast, and (2) the optical path length calculated from the phase can be measured precisely using the digital phase detector of a laser rangefinder. The optical properties of the tissue-like medium were measured accurately and quickly.

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Periodical:

Edited by:

Arturs Medvids

Pages:

318-321

DOI:

10.4028/www.scientific.net/AMR.222.318

Citation:

T. Yamashita et al., "Accurate and Fast Estimation of Optical Properties Using Optical Path Length and Spatially Resolved Reflectance Measurement", Advanced Materials Research, Vol. 222, pp. 318-321, 2011

Online since:

April 2011

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$35.00

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