Structural and Optical Properties of ZnO Nanorods Thin Films by Solution-Growth Method

Abstract:

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Highly c-axis-oriented ZnO nanorods thin films were obtained on silica glass substrates by a simple solution-growth technique. The most compact and vertically-aligned ZnO nanorods thin film with the thickness of ~800 nm and average hexagonal grain size of ~200 nm exhibits the average visible transmittance 85%, refractive index 1.74, and packing density 0.84. As we demonstrate here, the solution-growth technique was used to produce high-quality and dense ZnO nanorods thin films, and is an easily controlled, low-temperature, low-cost, and large-scale process for the fabrication of optical-grade thin films.

Info:

Periodical:

Advanced Materials Research (Volumes 225-226)

Edited by:

Helen Zhang, Gang Shen and David Jin

Pages:

597-600

DOI:

10.4028/www.scientific.net/AMR.225-226.597

Citation:

C. C. Ting and S. P. Chang, "Structural and Optical Properties of ZnO Nanorods Thin Films by Solution-Growth Method", Advanced Materials Research, Vols. 225-226, pp. 597-600, 2011

Online since:

April 2011

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Price:

$35.00

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