Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization

Abbasi A. Gandhi; I.Z. Rahman; M.V.K. Mousavi; M.A. Rahman

doi:10.4028/www.scientific.net/AMR.264-265.518

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 264-265Sm-Doped NiFe Thin Films: Structural and Magnetic...

Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization

Abstract:

This paper reports on the effect of Sm doping concentration on structural and static magnetic properties of electrodeposited NiFe thin films. A reduction of Ni concentration from 80 to 50 percent was observed as the Sm concentration increased from 0 to 25%. XRD analyses revealed that a transition from crystalline to partially disordered state occurred on the Sm-doped NiFe thin films and ultimately transformed to amorphous state at higher concentration. The saturation magnetization decreased to ~50% at 25% Sm doping as compared to that of NiFe thin films.

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Advanced Materials Research (Volumes 264-265)

Pages:

518-523

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.264-265.518

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Online since:

June 2011

Authors:

Abbasi A. Gandhi, I.Z. Rahman, M.V.K. Mousavi, M.A. Rahman

Keywords:

Electro-Deposition, Magnetic Thin Film, NiFe Thin Films, RE Doped Magnets

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