Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization
This paper reports on the effect of Sm doping concentration on structural and static magnetic properties of electrodeposited NiFe thin films. A reduction of Ni concentration from 80 to 50 percent was observed as the Sm concentration increased from 0 to 25%. XRD analyses revealed that a transition from crystalline to partially disordered state occurred on the Sm-doped NiFe thin films and ultimately transformed to amorphous state at higher concentration. The saturation magnetization decreased to ~50% at 25% Sm doping as compared to that of NiFe thin films.
M.S.J. Hashmi, S. Mridha and S. Naher
A. A. Gandhi et al., "Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization", Advanced Materials Research, Vols. 264-265, pp. 518-523, 2011