Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization

Abstract:

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This paper reports on the effect of Sm doping concentration on structural and static magnetic properties of electrodeposited NiFe thin films. A reduction of Ni concentration from 80 to 50 percent was observed as the Sm concentration increased from 0 to 25%. XRD analyses revealed that a transition from crystalline to partially disordered state occurred on the Sm-doped NiFe thin films and ultimately transformed to amorphous state at higher concentration. The saturation magnetization decreased to ~50% at 25% Sm doping as compared to that of NiFe thin films.

Info:

Periodical:

Advanced Materials Research (Volumes 264-265)

Edited by:

M.S.J. Hashmi, S. Mridha and S. Naher

Pages:

518-523

DOI:

10.4028/www.scientific.net/AMR.264-265.518

Citation:

A. A. Gandhi et al., "Sm-Doped NiFe Thin Films: Structural and Magnetic Characterization", Advanced Materials Research, Vols. 264-265, pp. 518-523, 2011

Online since:

June 2011

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Price:

$35.00

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