Electopolishing of P-Type Silicon Thin Films in Hydrofluoric Acid Solutions

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Abstract:

Anodic dissolution on p-type silicon thin film in hydrofluoric acid solutions leads to a reduction of roughness on these surfaces. The electrochemical behavior in different HF concentration is investigated by linear sweep scan, and it is found that the HF has an important role in electrochemical behaviors, and the anodic dissolution rate increases with increasing HF concentration. A smooth surface state can be obtained in HF solutions, and the technique is promising for fabrication of reflecting silicon surfaces.

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Advanced Materials Research (Volumes 308-310)

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1080-1083

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August 2011

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© 2011 Trans Tech Publications Ltd. All Rights Reserved

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[1] C. Liu, Mater. Chem. Phys., 42,1995,87-90.

Google Scholar

[2] J. Rappich, H. Jungblut, M. Aggour, H. J. Lewerenz, J. Electrochem. Soc., 141(8), 1994, L99-L102.

DOI: 10.1149/1.2055109

Google Scholar

[3] C. Serre, S. Barret, and R. Herino, J. Electrochem. Soc., 141(8),1994, 2049-2053.

Google Scholar

[4] A. Slimani, A. Iratni, J.N. Chazalviel, N. Gabouze, F. Ozanam, Electrochimica Acta 54, 2009, 3139–3144.

DOI: 10.1016/j.electacta.2008.11.052

Google Scholar

[5] T. P. Hoar, J.A.S. Mowat, Nature, 165, 1950, 64-65.

Google Scholar

[6] A. Uhlir, Bell System Tech. J., 35, 1956, 333-337.

Google Scholar

[7] K.B. Sundaram V.H. Desal, Journal of Materials Science, 8, 1997, 99-101.

Google Scholar

[8] D. R. Turner, J. Electrochem. Soc. 105(7), 1958, 402-408.

Google Scholar

[9] P. C. Searson, X.G. Zhang, J. Electrochem. Soc., 137(8), 1990, 2539-2546.

Google Scholar

[10] C. Fang, H. Foll , J. Carstensen, J. Electroanal. Chem. 589, 2006, 259–288

Google Scholar

[11] R. L. Meek, J. Electrochem. Soc., 118, 1971, 437-441.

Google Scholar

[12] X. G. Zhang, S. D. Collins, and R. L. Smith, J. Electrochem. Soc., 136(5),1989, 1561-1565.

Google Scholar

[13] R. Memming, G. Schhwandt, Surface Science, 4,1966, 109-124.

Google Scholar

[14] P. Allongue, P. Jiang, V. Kirchner, A. L. Trimmer, R. Schuster, J. Phys. Chem. B 108, 2004, 14434-14439.

DOI: 10.1021/jp0497312

Google Scholar

[15] V. Lehmann, H. Foll, J. Electrochem. Soc., 137(2), 1990, 653-659.

Google Scholar