Dependence of Hysteresis Loops on Thickness of Thin Nickel Films Prepared by RF Sputtering

Abstract:

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Nickel films of varying thicknesses between 70 and 300 nm were deposited on glass substrates by RF sputtering and their broad (111) FCC peaks were identified by X-ray diffraction. The surface roughness and sub-micron grains were revealed by scanning electron microscopy. According to vibrating sample magnetometry, the films showed hysteresis loops with comparable coercive field and saturation field for the in-plane and perpendicular magnetizations. The increase in thickness substantially increased the magnetization and the squareness of the Ni films. The thickness can be classified into 2 regimes by the variation of squareness. The films are thinner than 200 nm showed the in-plane anisotropy whereas the perpendicular anisotropy was developed in the case of the thickness above 200 nm.

Info:

Periodical:

Advanced Materials Research (Volumes 335-336)

Edited by:

Yun-Hae Kim, Prasad Yarlagadda, Xiaodong Zhang and Zhijiu Ai

Pages:

1443-1447

DOI:

10.4028/www.scientific.net/AMR.335-336.1443

Citation:

W. Rattanasakulthong et al., "Dependence of Hysteresis Loops on Thickness of Thin Nickel Films Prepared by RF Sputtering", Advanced Materials Research, Vols. 335-336, pp. 1443-1447, 2011

Online since:

September 2011

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$35.00

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