Failure Prevention on Application of Flexible Printed Circuits

Article Preview

Abstract:

With the compact nature and the high electrical-connection density, flexible printed circuits (FPC) can achieve considerable weight, space and cost savings over the use of traditional rigid printed circuit boards. In recent years, it becomes impossible without flexible printed circuit technology in electronic products especially for Flip mobile phones. Whereas, its application is not always satisfied the engineering of assembly and reliability due to the existing of mechanical stress in soldering process and service environment. In this paper, through analyzing the common failures in mass production including via interconnection, trace crack and black pad, some preventions were suggested to improve the quality and reliability at the aspect of manufacture, process, mechanical design and dynamic stress distribution philosophy.

You might also be interested in these eBooks

Info:

Periodical:

Advanced Materials Research (Volumes 383-390)

Pages:

4648-4652

Citation:

Online since:

November 2011

Export:

Price:

Permissions CCC:

Permissions PLS:

Сopyright:

© 2012 Trans Tech Publications Ltd. All Rights Reserved

Share:

Citation:

[1] Kuldip Johal, Hugh Roberts, Electroless Nickel/Immersion Gold technology for improved ductility of flex and rigid-flex applications, Pan Pacific Symposium, (2005).

Google Scholar

[2] Liu Janet, V226 Flex cable broken problem fix, Motorola internal technical symposium 2005, 86-90.

Google Scholar

[3] Sun Junling, Flip flex improvement in Hainan project, Motorola internal technical symposium, 2006, pp.1523-1533.

Google Scholar

[4] Fjelstad, Joseph (1999) Flexible circuitry – technology background and important fundamental issues, Circuit World, Vol. 25, No. 2, pp.6-10.

DOI: 10.1108/03056129910258207

Google Scholar

[5] Mac Zhi, The Reliability assessment for triplet P-Flex trace cracked issue, Motorola internal technical symposium, 2004, pp.1017-1021.

Google Scholar

[6] Paul Reid, Gareth Parry and Paul Andrews, Microvia failure in Lead-Free assembly, Parts 1 and 2, 2006 printed circuit design&manufacture, http: /www. pcdandf. com/cms/magazine/95/2712.

Google Scholar

[7] Rock Hill, Black pad versus brittle fracture, 2002, ATOTECH.

Google Scholar