Optical Properties of CulnSi Nanocomposite Thin Film Deposited by Magnetron Co-Sputtering

Jian Sheng Xie; Jin Hua Li; Luan Ping

doi:10.4028/www.scientific.net/AMR.403-408.1089

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HomeAdvanced Materials ResearchAdvanced Materials Research Vols. 403-408Optical Properties of CulnSi Nanocomposite Thin...

Optical Properties of CulnSi Nanocomposite Thin Film Deposited by Magnetron Co-Sputtering

Abstract:

Thin CuInSi nanocomposite films were prepared by magnetron co-sputtering. The structures of CuInSi nanocomposite films were detected by X-ray diffraction(XRD); XRD studies of the annealed films indicate the presence of CuInSi, the main crystal phase peak is at 2θ=42.400°. The transmittance (T) spectra of the films were measured by Shimadzu UV-2450 double beam spectrophotometer. The band gap has been estimated from the optical absorption studies and found to be about 1.40 eV, but changes with purity of CuInSi.

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Periodical:

Advanced Materials Research (Volumes 403-408)

Pages:

1089-1093

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.403-408.1089

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Online since:

November 2011

Authors:

Jian Sheng Xie, Jin Hua Li, Luan Ping

Keywords:

CuInSi Film, Magnetron Co-Sputtering, Nanocomposite, Nanocrystalline, Optical Absorption

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