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Probing Swelling and Shrinking Process of Polystyrene Film by In Situ Ellipsometry

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Abstract:

We investigated the structural evolution of Polystyrene films at various conditions through multi-wavelength ellipsometry. We studied the thickness of film dependent of the process of swelling/shrinking, and the influence of the intensity of atmosphere，combining with PM (polarization microscope) to characterize the surface morphology. Results indicated that the increase and reduction of the film thickness are non-linear. Maximum swelling ratio and the variation of film thickness depend on the initial thickness of film and the intensity of atmosphere. Furthermore, the results demonstrated that in-situ multi-wavelength ellipsometry is an unique means to investigate the behavior of swelling and shrinking of film.

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Materials Processing Technology, ICAMMP2011 View Preview

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Periodical:

Advanced Materials Research (Volumes 418-420)

Pages:

333-336

DOI:

https://doi.org/10.4028/www.scientific.net/AMR.418-420.333

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Online since:

December 2011

Authors:

Xiu Yun Yang, Jian Peng Li, Yang Liu, Xiu Xia Gao

Keywords:

Ellipsometry, Polystyrene Film, Swelling and Shrinkage

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