A Bluge Rotational Tool in Thin Film Nanostructures Removal

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A bluge rotational tool has been developed as an effective precision electrochemical removal for the thin film nanostructures from LCD panels. This ultra-precise process effectively removes defective Indium-Tin-Oxide layers allowing LCD panels to be returned to the production line and significantly reduces costs. In the current experiment a 7th Generation TFT-LCD panel was used. A high rotational speed of the cheek rotational tool elevates discharge mobility and improves the removal effect. A negative electrode of large diameter with a small end radius provides higher current density and also improves the removal affect. Pulsed direct current can improve the effect of dregs discharge and is advantageous when combined with a higher electric power. A fast feed combined with a high current flow results in very effective removal of the color filter layer. This novel design using electrochemical removal as a precision recycling process for removing ITO layers from LCD panels is clean, effective and very fast.

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3-6

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January 2012

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© 2012 Trans Tech Publications Ltd. All Rights Reserved

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[1] H.S. Guh: Fundamentals and Applications of Optoelectronic Liquid Crystal Display Technology, MNew Wun Ching Developmental Publishing Co., Ltd., Taiwan, (2004).

Google Scholar

[2] Kim Daeil and Kim Steven: Int'l J. of Surface and Coatings Technology Vol. 154 (2002), pp.204-208.

Google Scholar

[3] M. Datta, and D. Landolt: Journal of Applied Electrochemistry, Vol. 13 (1983), pp.795-802.

Google Scholar

[4] L. Cagnon, V. Kirchner, M. Kock, R. Schuster, G. Ertl, W.T. Gmelin and H. Kuck: Z. Phys. Chem. Vol. 217 (2003), pp.299-313.

Google Scholar

[5] V. K. Jain, P. G. Yogindra and S. Murugan: Tools Manufact. Vol. 27, No. 1 (1987), pp.1135-1349.

Google Scholar

[6] P.S. Pa: Journal of Materials Processing Technology Vol. 532-533 (2006), pp.965-968.

Google Scholar

[7] B.H., Kim, S.H., Ryu, S.H., Choi, and C.N., Chu: Journal of Micromechanics and Microengineering Vol. 15 (2005), pp.124-129.

Google Scholar

[8] P.M. Lee, H.Y. Chen: IEEE Conference Proceeding Vol. 1 (2005), pp.780-783.

Google Scholar